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Introduction to Industrial Forensics Q&A Recap

[fa icon="calendar'] Apr 10, 2013 4:30:09 PM / by Admin posted in Blog, contamination testing, FTIR, industrial forensics, Materials Science, Raman, SEM/EDS, microscopy

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On April 2nd, Dave Exline, Senior V.P. and Antonio Scatena, Laboratory Manager at Gateway Analytical hosted a webinar designed for manufacturing managers, quality control managers and analytical lab personnel. During this webinar, our presenters discussed the various areas of an industrial forensic investigation, including contamination testing to control contamination of raw materials, processes and products; different types of quality control systems; and took the audience into the lab to discuss how to prepare samples for testing using various analytical techniques including microscopy, SEM/EDS, FTIR and Raman. They also discussed how to interpret the data collected and what type of conclusions can be made from your findings. Finally, our presenters provided example case scenarios to demonstrate the methodology of industrial forensic analysis.

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Gateway Analytical Receives ISO 17025:2005 Accreditation from the American Association for Laboratory Accreditation

[fa icon="calendar'] Feb 5, 2013 1:29:21 PM / by Admin posted in A2LA Accredited Laboratory, Blog, fluorescence microscopy, FTIR, industrial forensics, ISO 17025:2005 Accreditation, Materials Science, News Releases, Optical Microscopy, Polarized light microscopy, Quality Assurance, quality assurance, quality control, quality system, Raman, SEM/EDS

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PITTSBURGH, PA – Gateway Analytical announced today that the company received its 17025:2005 accreditation from the American Association for Laboratory Accreditation (A2LA). This accreditation is another illustration of Gateway’s commitment to quality and technical expertise, and focuses on material science and industrial forensics laboratory testing.

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