[fa icon="calendar'] Feb 5, 2013 1:29:21 PM / by Admin posted in A2LA Accredited Laboratory, Blog, fluorescence microscopy, FTIR, industrial forensics, ISO 17025:2005 Accreditation, Materials Science, News Releases, Optical Microscopy, Polarized light microscopy, Quality Assurance, quality assurance, quality control, quality system, Raman, SEM/EDS
PITTSBURGH, PA – Gateway Analytical announced today that the company received its 17025:2005 accreditation from the American Association for Laboratory Accreditation (A2LA). This accreditation is another illustration of Gateway’s commitment to quality and technical expertise, and focuses on material science and industrial forensics laboratory testing.
[fa icon="calendar'] Jan 29, 2013 2:43:55 PM / by Cara Plese posted in analytical testing, Authors, Blog, Confocal Raman, confocal Raman spectroscopy, forensics, FTIR, GSR analysis, gunshot residue analysis, materials science, Optical Microscopy, pharmaceutical, Polarized light microscopy, quality control, sem-eds
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